Reliability Physics and Engineering: Time-To-Failure Modeling

By J.W. McPherson and McPherson

Book Overview

Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications

Explains the fundamentals of reliability physics and engineering tools for building better products

Contains statistical training and tools within the text

Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.

• Format: Hardcover
• Language: English
• ISBN: 3319936824
• ISBN13: 9783319936826
• Release Date: January 2019
• Publisher: Springer
• Length: 463 Pages
• Weight: 1.87 lbs.
• Dimensions: 1.1" x 6.1" x 9.2"