Probing Crystal Plasticity at the Nanoscales: Synchrotron X-Ray Microdiffraction

By Arief Suriadi Budiman

Introduction.- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab.- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.- Electromigration-induced Plasticity in Cu Interconnects: The Texture Dependence.- Industrial Implications of Electromigration-induced Plasticity in Cu Interconnects: Plasticity-amplified Diffusivity.- . Indentation Size Effects in Single Crystal Cu as Revealed by Synchrotron X-ray Microdiffraction.- Smaller is Stronger: Size Effects in Uniaxially Compressed Au Submicron Single Crystal Pillars.- Conclusions and Future Directions.

• Format: Paperback
• Language: English
• ISBN: 9812873341
• ISBN13: 9789812873347
• Release Date: January 2015
• Publisher: Springer
• Length: 118 Pages
• Weight: 0.42 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"