Noncontact Atomic Force Microscopy

Book Overview

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

• Format: Paperback
• Language: English
• ISBN: 3642627722
• ISBN13: 9783642627729
• Release Date: October 2012
• Publisher: Springer
• Length: 440 Pages
• Weight: 1.41 lbs.
• Dimensions: 0.9" x 6.1" x 9.2"