Nanotribology and Nanomechanics I: Measurement Techniques and Nanomechanics

By Bharat Bhushan

Book Overview

Introduction - Measurement Techniques and Applications.- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- General and Special Probes in Scanning Microscopies.- Force Calibration Techniques for AFM Cantilevers.- Noncontact Atomic Force Microscopy and Related Topics.- Low Temperature Scanning Probe Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Single Molecular Recognition Force Spectroscopy and Imaging.- Nanomechanical Properties of Solid Surfaces and Thin Films.- Computer Simulations of Nanometer-Scale Indentation and Friction.

• Format: Paperback
• Language: English
• ISBN: 3642427995
• ISBN13: 9783642427992
• Release Date: November 2014
• Publisher: Springer
• Length: 623 Pages
• Weight: 1.96 lbs.
• Dimensions: 1.3" x 6.1" x 9.2"