Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield

By Mohamed Abu Rahma and Mohab Anis

Introduction.- Variability in Nanometer Technologies and Impact on SRAM.- Variarion-Tolerant SRAM Write and Read Assist Techniques.- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control.- A Methodology for Statistical Estimation of Read Access Yield in SRAMs.- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.

• Format: Paperback
• Language: English
• ISBN: 1493902202
• ISBN13: 9781493902200
• Release Date: October 2014
• Publisher: Springer
• Length: 172 Pages
• Weight: 0.60 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"