Microelectronic Failure Analysis Desk Reference

By Thomas W. Lee and Seshu V. Lee, Thomas W.;Pabbisetty

A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical

• Format: Hardcover
• Language: English
• ISBN: 087170479X
• ISBN13: 9780871704795
• Release Date: January 1993
• Publisher: Materials Park, Ohio, U.S.A.: Asm Intl
• Length: 350 Pages
• Weight: 3.35 lbs.
• Dimensions: 12.0" x 1.8" x 9.3"