Image Formation in Low-Voltage Scanning Electron Microscopy

by Ludwig Reimer

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0819412066
• ISBN13: 9780819412065
• Release Date: January 1993
• Publisher: SPIE-International Society for Optical Engine
• Length: 143 Pages