Fundamentals of Surface and Thin Film Analysis

By Leonard C. Feldman

This book focuses on the physics underlying techniques used to analyze the surface region of materials. It is a book written for the materials scientist interested in the use of electron... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0135005701
• ISBN13: 9780135005705
• Release Date: January 1986
• Publisher: Pearson
• Length: 376 Pages
• Weight: 1.40 lbs.
• Dimensions: 0.8" x 5.9" x 8.9"